C-INV : Conférences données à l’invitation du comité d’organisation dans un congré national ou international

J. Raoult, S. Jarrix, Perturbation de composants, circuits, systèmes par injection de champ proche, GDR ondes –GT 5, Journée thématique champ proche pour la cem des composants et circuits, Toulouse le 25 juin 2013

ACL : Articles dans revues internationales ou nationales avec comité de lecture répertoriées par l’AERES dans des bases de données internationales

I. El Moukhtari, V. Pouget, F. Darracq, C. Larue, P. Perdu, D. Lewis, “Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology”, IEEE Transactions on Nuclear Science, 10.1109/ TNS.2012.2231437, accepté pour publication, 2013.

F. Wrobel, A. D. Touboul, L. Dilillo, and F. Saigne, “Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM Cell,” IEEE Transactions on Nuclear Science,vol. PP, n° 99, pp. 1-5, 2013.

A. D. Touboul, L. Foro, F. Wrobel, K. Guetarni, J. Boch and F. Saigné, Neutrons-induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation, IEEE Transactions on Nuclear Science, accepted for publication in 2013.

S. Danzeca, L. Dusseau, P. Peronnard, G. Spiezia. “A New Testing Methodology of an Analog to Digital Converter for the LHC Mixed Radiation Field” Accepté pour publication dans IEEE TNS, 2013.

J. Mekki, M. Brugger, S. Danzeca, L. Dusseau, K. Røed, G. Spiezia “Mixed Particle Field Influence on RadFET Responses Using Co-60 calibration”, Accepté pour publication dans IEEE TNS, 2013

Nicolas J-H. Roche, S. P. Buchner, F. Roig, L. Dusseau, Senior J. Warner, J. Boch, D. McMorrow, F. Saigné, G. Auriel, B. Azaïs "Investigation of Flip-Flop Effects in a Linear Analog Comparator-with-Hysteresis Circuit" Accepté pour publication dans IEEE TNS, 2013.

R. Arinero, A. D. Touboul, M. Ramonda, C. Guasch, Y. Gonzalez-Velo, J. Boch, F. Saigné, “Conductive atomic force microscopy as a tool to reveal high ionising dose effects on ultra thin SiO2/Si structures“, Applied Nanoscience, Volume 3, Issue 3, pp 235-240 (2013).

T. Dubois, J.J. Laurain, J. Raoult, S. Jarrix, “Effect of Continuous Wave Electromagnetic Interference on a Microwave Oscillator System: From VCO to PLL to QPSK receiver”, IEEE Transactions on Electromagnetic Compatibility, accepted for publication in 2013.

S. Buchner, F. Miller, V. Pouget, D. McMorrow, “Pulsed-Laser Testing for Single-Event Effects Investigations”, IEEE Transactions on Nuclear Science, 10.1109/TNS.2013.2255312, accepté pour publication, 2013.

C-ACTI : Communications avec actes dans un congrès international

A. Privat, A. D. Touboul, J. R. Vaillé, S. Bourdarie, R. Arinero, F. Wrobel, N. Chatry, G. Chaumont, E. Lorfèvre, F. Saigné, Post-irradiation-Gate-Stress on Power MOSFETs : Quantification of latent defects-induced reliability degradation, NSREC 2013, July 8-12, 2013, San Francisco (USA).

A. Kaouache, F. Wrobel, F. Saigné, A. D. Touboul,, R.D. Schrimpf, Analytical Method to Evaluate Soft Error Rate Due to Alpha Pollutants, NSREC 2013, July 8-12, 2013, San Francisco (USA)

A. Doridant, J. Raoult, S. Jarrix « Susceptibility of a low frequency bipolar transistor subject to a double aggression: dose irradiation and high frequency CW or pulse modulated signal”. European Test and Telemetry Conference (ETTC) 1-13 Juin 2013 Toulouse.

F. Roig, L. Dusseau, A. Khachatrian, N. J-H. Roche, A. Privat, J.-R. Vaillé, J. Boch, J. H. Warner, F. Saigné, S. P. Buchner, D. McMorrow, P. Ribeiro, G. Auriel, B. Azais, R. Marec, P. Calvel, F. Bezerra and R. Ecoffet, Member. "Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers" 2013 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2013) 08 Jul - 12 Jul 2013, Hyatt San Francisco, CA, USA.

N. J-H. Roche, F. Roig, L. Dusseau, A. Khachatrian, A. Privat, J.-R. Vaillé, J. Boch, J. H. Warner, F. Saigné, S. P. Buchner, D. McMorrow, P. Ribeiro, G. Auriel, B. Azais, R. Marec, P. Calvel, F. Bezerra and R. Ecoffet "Investigation on Manufacturing Discrepancies Impact on TID-ASETs Synergistic Effect in LM124 Operational Amplifier" SEE Symposium 2013 April 9-12, 2013 in La Jolla, CA.

A. Michez, J. Boch, S. Dhombres, F. Saigné, A. D. Touboul, J-R. Vaillé, L. Dusseau, E. Lorfèvre, R. Ecoffet, "Modeling Dose Effects in Electronics Devices: Dose and Temperature Dependence of Power MOSFET", ESREF2013, September 30th - October 4th 2013 Arcachon.

R. Omarouayache, J. Raoult, S. Jarrix, L. Chusseau, P. Maurine, “Magnetic Microprobe Design for EM Fault Attack” EMC Europe 2013, September 2-6, 2013, Brugge.

D. McMorrow, A. Khachatrian, J. H. Warner, S. P. Buchner, N. Kanyogoro, J. S. Melinger, N. J.-H. Roche, V. Pouget, C. Larue, “Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses with Sub-Micrometer Spot Sizes”, IEEE NSREC 2013, July 8-12, 2013, San Francisco (USA)

I. El Moukhtari, V. Pouget, C. Larue, D. Lewis, P. Perdu, “Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell”, ESREF 2013, September 30th - October 4th 2013 Arcachon (France).

N. Mbaye, V. Pouget, F. Darracq, D. Lewis, "Characterization and modelling of laser-induced single-event burn-out in SiC power diodes”, ESREF 2013, September 30th - October 4th 2013 Arcachon (France).

CP : Communications à caractère pédagogique

J-M Galliere and J. Boch, “A toolkit to demystify CMOS Active Pixel Sensors”, International Conference on Microelectonics System Education, 2013.

C-OUV : Contributions à des Ouvrages collectifs

R. Arinero and G. Lévêque, “Finite Element Modelling of AFM cantilevers“, in Acoustic Scanning Probe Microscopy (NanoScience and Technology), Ed. Francesco Marinello, Daniele Passeri and Enrico Savio, Springer (Springer Science+Business Media Physics Editorial IV), ISBN: 978-3-642-27493-0 (Print) 978-3-642-27494-7 (Online) (2013).