Groupe Radiac

Groupe Radiac - 2011

C-INV : Conférences données à l’invitation du comité d’organisation dans un congré national ou international

R. Omarouayache J. Raoult, S. Jarrix PH. Maurine, L. Chusseau, "GDR ondes – GT 2 – GT 5 : Journée thématique Sonde de champ proche", Paris, 17 Mars 2011.

A.D. Touboul, "Exemple de défaillances d’IGBT Trench sous faisceau de neutrons", RADSOL GDR ERRATA, Juin 2011, Paris (France).

A.D. Touboul, "Atmospheric Radiation effects on Electronics: Destructive Single Event Effects at ground level", 12th IEEE Latin-American Test Workshop (LATW2011), March 27th – 30th, 2011, Porto de Galinhas (PE), Brazil.

ACL : Articles dans revues internationales ou nationales avec comité de lecture répertoriées par l’AERES dans des bases de données internationales

A. D. Touboul, R. Arinero, M. Ramonda, “Use of AFM to Study Single Heavy Ion-Induced Localized Structural Modifications”, Microscopy and Analysis, Volume 25, Issue 3 April 2011.

C. Deneau, J.-R. Vaillé L. Dusseau, J. Mekki, P. Garcia, D. Boscher Bezerra, E. Lorfèvre5, R. Ecoffet. “First In-flight Data Analysis of Displacement Damage on the OSL Sensor On-board CARMEN-2” Volume: 58 , Issue: 3 , Part: 2 Page(s): 939 – 944 (2011)

G. A. Schwartz, C. Riedel, R. Arinero, P. Tordjeman, A. Alegría and J. Colmenero, “Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)”, Ultramicroscopy, Volume 111, Issue 8, p. 1366-1369 (2011).

R. Arinero, W. Hourani, A.D. Touboul, B. Gautier, M. Ramonda, D. Albertini, L. Militaru, Y.Gonzalez-Velo, C. Guasch, F. Saigné, “Towards a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02/Si films: Investigation of the best experimental conditions with a Conductive-Atomic Force Microscope”, Journal of Applied Physics, Volume 110, p. 014304 (2011).

R. Arinero, E. X. Zhang, N. Rezzak, R. D. Schrimpf, D. M. Fleetwood, B. K. Choï, A. B. Hmelo, J. Mekki, A. D. Touboul, F Saigné, “High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors”, Microelectronics Reliability, 51, pp. 2093-2096 (2011).

M. M. Kummali, G. A. Schwartz, A. Alegria, R. Arinero, J. Colmenero, “Compatibility Studies of PS/PVAc Blends using Electrostatic Force Microscopy”, J. Polymer Science part B: Polymer Physics 49, 1332-1338 (2011).

C. Riedel, A. Alegría, G. A. Schwartz, R. Arinero, J. Colmenero, J. J. Sáenz, “On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: a numerical study”, Applied Physics Letters, 99, 023101 (2011).

W. Hourani, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero, “Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope”, Microelectronics Reliability, , 51, pp. 2097-2101 (2011).

B. Yahmadi, N. Kamoun, C. Guasch, C, et R. Bennaceur "Synthesis and characterization of nanocrystallized In2S3 thin films via CBD technique", Mat Chem Phys. 127 239-247. (2011)

C Riedel, A Alegría, R Arinero, J Colmenero, J J Sáenz, “Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence”, Nanotechnology, 22, 345702 (2011).

C. Riedel, R. Arinero, A. Alegria, J. Colmenero, J. J. Saenz, “Three-Dimensional Tomography of Single Charge Inside Dielectric Materials Using Electrostatic Force Microscopy", Material Research Society, Vol. 1421, pp5-9, 2012.

T. Dubois, J. Raoult S. Jarrix, A. Blain, A. Doridant "Optimal Electric Wave Propagation Parameters on a Transmission Line --- Schotttky Diode de System" PIERS Letters, vol. 27 , pp. 125-132 , 2011

Y. Gonzalez Velo, J. Boch, F. Pichot, J. Mekki, N.J-H Roche, S. Perez, C.Deneau, F. Saigné, L. Dusseau, E.Lorfevre, “The use of a scanning electron microscope as localized micro-beam irradiator”, IEEE Trans. Nuclear Science, vol. 58, no. 3, pp. 1104 - 1111, 2011.

N. J.-H .Roche, L. Dusseau, J. Mekki, S. Perez, J-R. Vaille, Y. Gonzalez Velo, J. Boch, F. Saigné, R. Marec, P. Calvel, F. Bezerra, G. Auriel, B. Azais, S.P Buchner, ” Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays”, Trans. Nuclear Science, vol. 58, no. 3, pp. 960 - 968, 2011.

J. Boch, Y. Gonzalez Velo, F. Saigné, N. J-H. Roche, S. Perez, R. D. Schrimpf, J.-R. Vaillé, L. Dusseau, J. Mekki, E. Lorfevre, R. Ecoffet “ELDRS: Optimization Tool for the Switched Dose Rate Technique”, IEEE TNS, 2011.

Y. Gonzalez Velo, J. Boch, F. Saigné, N.J.-H. Roche, S. Perez, C. Deneau, J.-R Vaille, L. Dusseau, R.D. Schrimpf, and E. Lorfevre. “Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP Transistors”, IEEE TNS, 2011

N. J-H. Roche, S. Perez, J. Mekki, Y. Gonzalez Velo, L. Dusseau, J. Boch, J-R. Vaille, F. Saigné, R. Marec, P. Calvel, F. Bezerra, G. Auriel, B. Azais, “Study of Synergism effect between TID and ATREE on the Response of the LM124 Operational Amplifier”, IEEE TNS, 2011.

F. Wrobel, JR. Vaille, D. Pantel, L. Dilillo, P. Rech, J. Galliere, A.D. Touboul, P. Chadoutaud, P. Cocquerez, M. Lacourty, T. Lam-Trong; J. Autran, C. Chatry, F. Laplanche, B. Azais, F. Saigne, “Experimental Characterization of an Atmospheric Environment With a Stratospheric Balloon”, IEEE Transactions on Nuclear Science, 58 , 3, pp.945-951 (2011)

L. Foro, A.D. Touboul, F. Wrobel, F. Saigne, “Development of Monte Carlo Modeling for Neutron-Induced Failures of Trench FieldStop IGBT”, IEEE Transactions on Nuclear Science, 58 (6), pp. 2748-2754, Dec. 2011.

F. Wrobel, F. Saigné, “MC-ORACLE: A tool for predicting Soft Error Rate”, Computer Physics Communications 182, 317-321, 2011

M. Gedion, F. Wrobel, F. Saigné et R. D. Schrimpf, "Uranium and Thorium Contribution to Soft Error Rate in Advanced Technologies”, IEEE Trans. On Nucl. Sci. 58 (3), pp. 1098-1103, jun 2011.

P. Rech, J-M. Galliere, P. Girard, F. Wrobel, F. Saigné, and L. Dilillo, “Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons”, IEEE Trans. On Nucl. Sci. 58 (3), pp. 855-861, jun 2011.

M. Benabdesselam, _A. Petitfils_, F. Wrobel, F. Mady, S. Marcié, E. Gheeraert, “Behavior of CVD diamond-based TL dosimeters in radiotherapy environments using photon and electron beams from treatment accelerators”, Diamond & Related Materials 20 (2011) 520--522

S. Martinie, J.L. Autran, D. Munteanu, F. Wrobel, _M. Gedion_, F. Saigné, “Analytical modeling of Alpha-particle Emission Rate at Wafer-level”, IEEE Trans. On Nucl. Sci. 58 (6), pp. 2798-2803, december 2011.

M. Gedion, F. Wrobel, F. Saigne, M. Portier, A.D. Touboul, R. D. Schrimpf, “Effect of the Uranium Decay Chain Disequilibrium on Alpha Disintegration Rate” IEEE Trans. On Nucl. Sci. 58 (6), pp. 2793-2797, decembre 2011

C-ACTI : Communications avec actes dans un congrès international

W. Hourani, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine, A. Grandfond, R. Arinero,“Tunneling atomic force microscopy for the nanoscale electrical and physical characterization of thin gate oxide films in different surrounding ambient”, ISPM Conference, 19 – 22 juin 2011, Munich (Germany).

R. Arinero, A. D. Touboul, M. Ramonda, C. Guasch, Y. Gonzalez-Velo, J. Boch, F. Saigné, “High ionizing dose effects on ultra thin SiO2/Si structures revealed by Conductive Atomic Force Microscopy”, the 12th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sevilla (Spain), 19-23 September, 2011.

C. Riedel, R. Arinero, A. Alegria, J. Colmenero, J. J. Saenz, “Three-Dimensional Tomography of Dielectric Materials Using Electrostatic Force Microscopy”, 2011 MRS Fall Meeting & Exhibit, November 28 - December 2, 2011, Hynes Convention Center, Boston, MA.

S. Jarrix, L. Dusseau, N. Chatry, P. Hoffmann, A. Doridant, A.Blain, T. Dubois, J. Raoult, P. Calvel, "First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors", 12th IEEE Latin American Test Workshop (LATW) 2011, 27 – 30 Mars, Recife (Brésil).

T. Dubois; J.-J. Laurin, J. Raoult, S. Jarrix “On the effect of amplitude modulated EMI injected on a PLL active ﬁlter”, 8th International Workshop on Electromagnetic Compatibility 6 – 9 Nov, 2011, Dubrovnik (Croatie).

A. Blain, J. Raoult, A. Doridant, S. Jarrix, T. Dubois, “Effects of CW interferences on a 5 GHz Monolithic VCO” 8th International Workshop on Electromagnetic Compatibility 6 – 9 Nov., 2011, Dubrovnik (Croatie).

A. Doridant, S. Jarrix, J. Raoult, A.Blain, N. Chatry, P. Calvel, P. Hoffmann, L. Dusseau “Impact of Total Ionizing Dose on the Electromagnetic Susceptibility of a single bipolar transistor” International Conference on Radiation and effects on Components and Systems 19 – 23 Sept., 2011, Séville (Espagne).

A. Doridant, J. Raoult, A.Blain, S. Jarrix, L. Dusseau, N. Chatry, P.Hoffmann, P. Calvel, “Electromagnetic Susceptibility of low frequency bipolar transistors subject to the total ionizing dose effect” 8th International Workshop on Electromagnetic Compatibility 6 – 9 Nov., Dubrovnik (Croatie), 2011.

J. Boch, Y. Gonzalez Velo, F. Saigné, N. J-H. Roche, S. Perez, R. D. Schrimpf, J.-R. Vaille, L. Dusseau, J. Mekki, E. Lorfevre, R. Ecoffet “ELDRS: Optimization Tool for the Switched Dose Rate Technique”, NSREC 2011, Las Vegas (USA), 2011.

Y. Gonzalez Velo, J. Boch, F. Saigné, N.J.-H. Roche, S. Perez, C. Deneau, J.-R Vaille, L. Dusseau, R.D. Schrimpf, et E. Lorfevre. “Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP Transistors”, NSREC 2011, Las Vegas (USA), 2011.

N. J-H. Roche, S. Perez, J. Mekki, Y. Gonzalez Velo, L. Dusseau, J. Boch, J-R. Vaille, F. Saigné, R. MarecC, P. Calvel, F. Bezerra, G. Auriel, B. Azais, “Study of Synergism effect between TID and ATREE on the Response of the LM124 Operational Amplifier”, NSREC 2011, Las Vegas (USA), 2011.

M. Wind, P. Beck, J. Boch, L. Dusseau, “Applicability of the Accelerated Switching Test Method – A Comprehensive Survey”, NSREC 2011, Las Vegas (USA), 2011.

S. Perez, L. Dusseau, Y. Gonzalez Velo, J-R. Vaille, J. Boch, F. Saigné, F. Bezerra, R. Ecoffet, “Erratic Degradation and Circuit Effects Induced by TID in a Typical Current Feedback Amplifier”, RADECS 2011, Sevilla (Spain), 2011.

Y. Gonzalez Velo, J. Boch, F. Saigné, N.J.-H. Roche, S. Perez, C. Deneau, J.-R Vaille, L. Dusseau, R.D. Schrimpf, et E. Lorfevre, “Room Temperature Annealing Effect on Biased Bipolar Devices during Switched Dose-Rate Experiments”, RADECS 2011, Sevilla (Spain), 2011.

M. Gedion, F. Wrobel, F. Saigné, M. Portier (Doctorant), A. D. Touboul, and R.D. Schrimpf, “Effect of Uranium Chain Disequilibrium on Alpha Disintegration Rate”, IEEE NSREC, July 2011, Las Vegas (USA).

L. Foro (Doctoant), A.D. Touboul, F. Wrobel, F. Saigné, Neutron-Induced Failures of Trench Gate Fieldstop IGBT, IEEE NSREC, July 2011, Las Vegas (USA).

M. Naceur (Doctoant), A.D. Touboul, M. Gedion, J.R Vaille, F. Wrobel, E.Lorfèvre, G.Chaumont, F. Saigné, “Synergy of non-ionizing and ionizing processes in the reliability degradation of Power MOSFETs oxide”, IEEE RADECS, September 2011, Sevilla (Spain).

L. Dilillo, P. Rech, J-M. Gallière, P. Girard , F. Wrobel and F. Saigné, “Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench”, LATW 2011, Porto de Galinhas, Brésil, 27-30 mars 2011.

S. Martinie, J.L. Autran,D. Munteanu, F. Wrobel, _M. Gedion_, F. Saigné, « Analytical modeling of Alpha-particle Emission Rate at Wafer-level”, NSREC 2011, Las Vegas (USA), juillet 2011.

P. Rech, J-M. Galliere, P. Girard, F. Wrobel, F. Saigné, and L. Dilillo, “Dynamic-Stress Neutrons Test of Commercial SRAMs”, NSREC 2011, Las Vegas (USA), juillet 2011.

L. Dilillo, A. Bosio, P. Rech, P. Girard, F. Wrobel, F. Saigné, “Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor”, IWASI 2011, Borgo Egnazia Savelletri di Fasano, Brindisi, (Italy), 28-29 June 2011.

P. Rech, J-M. Galliere, P. Girard, A. Griffoni, J. Boch, F. Wrobel, F. Saigné, and L. Dilillo, "Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays", RADECS 2011, , Seville (Espagne) septembre 2011.

C. Weulersse, F. Wrobel, F. Miller, T. Carrière, R. Gaillard, J.-R. Vaillé, and N. Buard, "A Monte-Carlo Engineer Tool for the Prediction of SEU Proton Cross Section from Heavy Ion Data", RADECS 2011, , Seville (Espagne) septembre 2011.

M. Gedion, F. Wrobel, F. Saigné, and R.D. Schrimpf, “Alpha-Soft Error Rate due to new generations of high-k gate oxides and metal gate electrodes in a 32 nm node”, RADECS 2011, , Seville (Espagne) septembre 2011.

A. Griffoni, J. van Duivenbode, D. Linten, E. Simoen, P. Rech, Luigi Dilillo, F. Wrobel, P. Verbist, and G. Groeseneken, “Neutrons-Induced Failure in Super-Junction, IGBT, and SiC Power Devices”, RADECS 2011, , Seville (Espagne) septembre 2011.

C-ACTN : Communications avec actes dans un congrès national

W. Hourani, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine, A. Grandfond, R. Arinero, “Etude électrique et physique à l’échelle nanométrique des couches minces de SiO2 thermique sous différentes atmosphères”, Forum des microscopies à sondes locales, Ecully, 28 mars – 1er avril 2011.

C. Riedel, R. Arinero, G. Lévêque, P. Tordjeman, M. Ramonda, G. Schwartz, A. Alegria, J. Colmenero, “Spectroscopie diélectrique par Microscopie à force électrostatique : application à l’étude de la dynamique des polymères nanostructurés”, Forum des microscopies à sondes locales, Ecully, 28 mars – 1er avril 2011.

CP : Communications à caractère pédagogique

T. Balard, C. Deneau, N. Roche, S. Perez, J. Boch, J-R. Vaillé, S. Jarrix, L. Dusseau, M. Saleman, “A delatcher on a cubesat”, CSSS 2011- The First International Conference on Small Satellites Systems, 5 – 8 Avril, 2011, Paris

Papier invité : S. Jarrix, L. Dusseau, M. Saleman, “Space projects at University Montpellier 2”, CSSS 2011- The First International Conference on Small Satellites Systems, 5 – 8 Avril, 2011, Paris

C-OUV : Contributions à des Ouvrages collectifs

R. Arinero, G. Lévêque, “Finite Element Modelling of AFM cantilevers”, Book title: Scanning Probe Acoustic Techniques, Nanoscience and Technology series, Ed. Francesco Marinello, Daniele Passeri, Enrico Savio, Springer (Springer Science+Business Media Physics Editorial IV), Accepted for publication (29/08/2011).

BRE : Brevets

A. Michez, “E.C.O.R.C.E”, Agence pour la protection des programmes Numéro de depôt :IDDN.FR.001.480010.S.P.2011.000.31235, date de dépôt : 1/12/2011