C-INV : Conférences données à l’invitation du comité d’organisation dans un congré national ou international
J. Boch, “TID and Dose Rate Switching Method” 9th ESA/ESTEC D/TEC-QCA Final Presentation Day, Villigen Suisse, 27 & 28 janvier 2009
L. Dusseau, “Status of ROBUSTA From University Montpellier 2” 2nd ESA Cubesats Workshop. ESA-ESTEC, Noordwijk, Hollande, 20-22 Janvier 2009
C. Guasch “Potentiel de surface : de l’échelle macroscopique à l’échelle nanométrique, quelques illustrations de résultats”, présentation orale le 22 décembre 2009 à Gafsa (Tunisie) lors des Journées Internationales de Physique des Matériaux et Applications (JIPMA 2009).
ACL : Articles dans revues internationales ou nationales avec comité de lecture répertoriées par l’AERES dans des bases de données internationales
N. Roche, Y. Gonzalez Velo, L. Dusseau, J. Boch, J-R. Vaille, F. Saigné, B. Azais, G. Auriel, E. Lorfevre, V. Pouget, S. P. Buchner, J-P. David, P. Calvel, R. Marec “Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits”, IEEE Trans. On Nucl. Sci, 56 (4), pp.1971-1977, Part 2, Aug. 2009.
Marinoni M, Touboul AD, Zander D, Petit C, Carvalho AMJF, Wrobel F, Saigne F, Weulersse C, Miller F, Carriere T, Lorfevre E, “Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown”, IEEE Trans. On Nucl. Sci, 56 (4), pp.2213-2217, Part 2, Aug. 2009.
Correas V, Saigne F, Sagnes B, Wrobel F, Boch J, Gasiot G, Roche P, “Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM”, IEEE Trans. On Nucl. Sci, 56 (4), pp.2050-2055, Part 2, Aug. 2009.
Roche N. JH, Gonzalez Velo YG, Dusseau L, Boch J, Vaille JR, Saigne F, Azais B, Auriel G, Lorfevre E, Pouget V, Buchner SP, David JP, Marec R, Calvel P, “Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits”, IEEE Trans. On Nucl. Sci, 56 (4), pp.1971-1977, Part 2, Aug. 2009.
F. Wrobel, F. Saigné, M. Gedion, J. Gasiot, R.D. Schrimpf “Radioactive Nuclei Induced Soft Errors at Ground Level”, IEEE Trans. On Nucl. Sci, 56 (6), pp.3437-3441, Part 1, Dec. 2009.
J. Boch, Y. Gonzalez Velo, F. Saigné, N. J-H. Roche, R. D. Schrimpf, J.-R. Vaillé, L. Dusseau, C. Chatry, E. Lorfèvre, R. Ecoffet “The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices”, IEEE Trans. On Nucl. Sci, 56 (6), pp.3347-3353, Part 1, Dec. 2009.
J. Mekki, L. Dusseau, M. Glaser, S. Guatelli, M. Moll, M. G. Pia, F. Ravotti “Packaging effects on RadFET sensors for High Energy Physics Experiments.” IEEE Trans. Nucl. Sci., Volume: 56 Issue: 4 Pages: 2061-2069 (2009).
C-ACTI : Communications avec actes dans un congrès international
F. Wrobel, F. Saigné, M. Gedion, J. Gasiot, R.D. Schrimpf, “Radioactive Nuclei Induced Soft Errors at Ground Level” 46th IEEE Nuclear Space and Radiation Effects Conference, Quebec, Canada, 20-24 Juillet 2009.
J. Boch, Y. Gonzalez Velo, F. Saigné, N. Roche, J.R. Vaillé, L. Dusseau, R.D. Schrimpf, C. Chatry, E. Lorfevre, R. Ecoffet, “The use of dose-rate switching experiments to characterize bipolar devices” 46th IEEE Nuclear Space and Radiation Effects Conference, Quebec, Canada, 20-24 Juillet 2009.
Y. Gonzalez Velo, J. Boch, N. Roche, S. Perez, J.R. Vaillé, L. Dusseau, F. Saigné, E. Lorfevre, R.D. Schrimpf, C. Chatry, A. Canals, “Investigation of the bias effect on total dose induced degradation on bipolar linear microcircuits” Proceedings of the 10th European Conference on Radiation and its Effects on Components and Systems, Bruges, Belgique, 14-18 Septembre 2009.
N.J-H. Roche, L. Dusseau, J. Boch, Y. Gonzalez Velo, J-R. Vaillé, F. Saigné, G. Auriel, B. Azais, S. P. Buchner, R. Marec, P. Calvel and F. Bezerra, “Development of a New Methodology to Model the Synergistic Effects between TID and ASETs”, Proceedings of the 10th European Conference on Radiation and its Effects on Components and Systems, Bruges, Belgique, 14-18 Septembre 2009
L. Dilillo, F. Wrobel, J.M. Gallière, F. Saigné, “Use of BOBST for the Detection of Neutrons Induced Errors in SRAM”, IWASI 2009, 3rd IEEE International Workshop On Advances in Sensors and Interfaces, Trani, Italy, 25-26 June 2009.
S. Buchner, N. Roche, M. Bernard, L. Dusseau, D. McMorrow, “ The Effects of Total Ionizing Dose on Single Event Effects” SEE Symposium, April 20-22 La Jolla, CA, USA 2009.
D. Benoit, L. Dusseau, M. Glaser, B. Mukherjee and F. Ravotti, “Performance studies of an optical-fiber OSL dosimetry system in pulsed high intensity radiation beams; 7th International Conference on Luminescent Detectors and Transformers of Ionizing Radiation LUMDETR 2009, 12-17 July 2009, Kraków, Poland.
T. Dubois, S. Jarrix, J. Raoult, A. Penarier, P. Nouvel, B. Azais,D. Gasquet, “Electromagnetic Susceptibility Studies of Op. Amp. And a VCO for a PLL application", 7th International Workshop on Electromagnetic Compatibility of IntegratedCircuits, 17-19 November, Toulouse, 2009. Ce papier a reçu le Best paper award de la conférence
J. Mekki, M. Moll, M. Fahrer, M. Glaser, L. Dusseau, “A new Approach in Characterizing the Response of Silicon p-i-n diodes used as Radiation Monitoring Sensors” IEEE-Radecs Conference, September 14-18 2009, Bruges, Belgium. Ce papier a reçu le Best student paper Award de la Conférence
C-ACTN : Communications avec actes dans un congrès national
T. Dubois, S. Jarrix, A. Blain, A. Penarier, P. Nouvel, D. Gasquet, B. Azais, " Etude de compatibilité et susceptibilité électromagnétique champ proche d’un système à base d'amplificateurs opérationnels" 16èmes Journées Nationales Micro-ondes, 27-29 Mai, Grenoble, 2009.
CP : Communications à caractère pédagogique
S. Perez, S. Jarrix, N. J-H. Roche, J. Boch, J-R. Vaillé, A.Pénarier, L. Dusseau, M. Saleman "ROBUSTA, a student satellite to serve the radiation effects community", 23rd Annual Conference on Smalll Satellites, UTAH (USA), session XII, 10 – 14 Août 2009
J-M. Gallière, J. Boch, “A Mixed TCAD/Electrical Simulation laboratory to Open Up the Microelectronics Teaching” IEEE International Conference on, Microelectronic Systems Education, July 25-27, San Fransisco, MSE'09, pp. 37-40, 2009
